Layered Structure Analysis of Multilayers by Use of X-Ray Reflectometry and X-Ray Fluorescence Analysis
نویسندگان
چکیده
منابع مشابه
X-ray Analysis of Magnetic Multilayers
Combined methods of X-ray reflectivity and X-ray diffraction were used in a structural study of Ag/NiFe multilayers with different thickness of the magnetic sublayer and during an annealing process. The results explain from the microscopic point of view distinctions found in their magnetic behavior. The XRD methods used are based on the distorted-wave Born approximation theory in the region clo...
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ژورنال
عنوان ژورنال: Journal of the Magnetics Society of Japan
سال: 1998
ISSN: 0285-0192
DOI: 10.3379/jmsjmag.22.601